UHV Kelvin Probe System
Package
UHV Kelvin Probe Head Unit
Digital Control Unit (UHV Version)
50mm or 100mm Manual Translator
Dell PC with 17” Monitor
Data Acquisition System (Pre-installed on PC)
Kelvin Probe Software (on CD and Pre-installed on PC)
NI-DAQ Software (on CD and Pre-installed on PC)
Kelvin Probe Manual
Scanning UHV Kelvin Probe
(Available in 20mm or 44mm travel X,Y and 25mm Z)
Digital Control Unit (UHV Version)
50mm or 100mm Manual Translator
Data Acquisition System (Pre-installed on PC)
Kelvin Probe Software (on CD and Pre-installed on PC)
NI-DAQ Software (on CD and Pre-installed on PC)
X,Y,Z Translation Stage to specification above
Kelvin Probe Manual
UHV
The mounting flange for the non-scanning probe is DN40 (CF2.75 inch OD) and
CF64, CF100 for our SKP systems. The UHV head stage features a voice coil
actuator and user defined flange-to-sample spacing. Please note that our
standard tip sizes are 4-8mm diameter and you would achieve 1-3 meV resolution
with such tips.
The standard head unit is designed for normal geometry, i.e.; the insertion port
is at 90o to the sample plane. The quoted voltage resolution for a 4-8mm
diameter tip is 1-3 meV: this is the highest resolution of any commercially
available Kelvin probe on the market and sub mV resolution is achievable with
the larger tip sizes. Note the actual work function resolution will depend upon
the electrical and mechanical noise in the vicinity of the measurement cell.
Some customers monitor the work function change as a function of system pressure
or substrate temperature. Accordingly the system software package allows for
these other parameters to be recorded using an additional input channel and
plotted against the change in work function. This is a digital system the Kelvin
Probe frequency, amplitude of oscillation, mean spacing, backing potential and
data acquisition parameters can be set by the user.
Further this is an off-null
system; i.e. the work function is calculated using two or more signal
peak-to-peak measurements performed at backing potentials on either side of
balance. Thus the actual Kelvin Probe signal is visible at all times during
measurement. In contrast, null-based detection systems require a phase sensitive
detector and the Kelvin Probe signal is nulled throughout.
|
Single Electron Transistor Device results scan
Kelvin Probe 50micron tip measuring a Single Electron Transistor Device
Scanning Kelvin Probe
UHV Kelvin Probe
Solar Panels
Scanning Kelvin Probe
|