Publications by Professor Iain D. Baikie

1. "Surface Potential and Topographical Analysis using a Scanning Kelvin Probe", I.D. Baikie, G.H. Bruggink and U. Peterman, EPSRC Scanning Probe Microscopy Initiative Newsletter (Invited Feature Article: Nov 1996).

2. "Characterisation of Oxides and Thin Film Characterisation using SKP", I.D. Baikie, G. Bruggink and S. Rival, Proc. UCPSS, p65 (1994).

3. "Si Surface Charge Imaging, Monitoring of Oxide Growth and Interface using SKP Microscopy", G. H. Bruggink and I. D. Baikie, Proc. UCPSS, p193, (1994).

4. "Thin Film Characterisation", I.D. Baikie and G. Bruggink, Mat. Res. Soc. Proc., 309, 35 (1993).

5. "Characterisation of Surface Preparation Methods using a Scanning Kelvin Probe", I.D. Baikie and G. Bruggink, Mat. Res. Soc. Proc., 315, 311 (1993).

6. "Application of Surface Photovoltage Spectroscopy in Surface Analysis", I.D. Baikie, Mat. Res. Soc. Proc., 259, 149 (1992).

7. "Silicon Surface Preparation: The Effect of Contamination and Sputter-induced Surface Roughness", I.D. Baikie, E. Venderbosch and B. Hall, Mat. Res. Soc. Proc., 261, 149 (1992).

8. "Preliminary studies on stress in metals, employing the Kelvin Method", G. Bruggink and I.D. Baikie, Proc. Residential Stress Conf., Univ. of Twente (1991).

9. "Very Low Pressure Oxide of Si and Ge surfaces", I.D. Baikie, Mat. Res. Soc. Proc., 204, 363 (1991).

10. "Preferential Island Nucleation at the Elbows of the Au(111) Herringbone Reconstruction Through Place Exchange", J.A. Meyer, I.D. Baikie, E. Kopatzki and R.J. Behm, Surf. Sci. 365, L647-L651 (1996).

11. "Combined Work Function and STM Study on Growth, Alloying and Oxidation of Epitaxial Aluminium Films on Ru(0001)", E. Kopatzki, H-G. Keck, I.D. Baikie, J.A. Meyer and R.J. Behm, Surf. Sci. 345, L11-L18 (1996).

12. "Noise and the Kelvin Method", I.D. Baikie, S. Mackenzie, P.J.Z. Estrup and J.A. Meyer, Rev. Sci. Instrum., 621326 (1991).

13. "Analysis of Stray Capacitance in the Kelvin Method", I.D. Baikie, E. Venderbosch, J.A. Meyer and P.J.Z. Estrup, Rev. Sci. Instrum., 62, 725 (1991).

14. "Thermal Desorption from co-existing Phases: H/Mo(100)", J.A. Meyer, I.D. Baikie, G.P. Lopinski, J.A. Prybyla and P.J.Z. Estrup, J. Vac. Sci. Technol., A8, 2468 (1990).

15. "Automatic Kelvin Probe Compatible with UltraHigh Vacuum", I.D. Baikie, K.O. van der Werf, J. Broeze and A. van Silfhout, Rec. Sci. Instrum., 60, 930 (1989).

16. "Integrated Automatic Modular Measuring System", I.D. Baikie, K.O. van der Werf and L.J. Hanekamp, Rev. Sci. Instrum., 59, 2075 (1988).

17. "A Novel UHV Kelvin Probe and it's application in the Study of Semiconductor Surfaces", Ph.D. Thesis, Univ. of Twente (1988), ISBN 90-9002444-1.

18. "Development of a Novel Holographic Beam Splitter", B.Sc Thesis, Heriot-Watt Univ. (1983)