The original apparatus of
 Lord Kelvin.


Cr deposited on Si(100)
Sample courtesy of
Dr. Bert Lagel,
 University of South Florida.


100nm ITO on glass - Sample courtesy of Dr. Dmitry Poplavskyy, OSRAM Opto Semiconductors Inc


100nm PEDOT:PSS - Sample courtesy of Dr. Dmitry Poplavskyy, OSRAM Opto Semiconductors Inc.

Welcome to the Kelvin Probe information site

The Kelvin Probe is a non-contact, non-destructive measurement device used to investigate properties of materials.
It is based on a vibrating capacitor and measures the work function difference, or for non-metals, the surface potential, between a conducting specimen and a vibrating tip.
The work function is an extremely sensitive indicator of surface condition and is affected by adsorbed or evaporated layers, surface reconstruction, surface charging, oxide layer imperfections, surface and bulk contamination, etc.
The Kelvin method was first postulated by the renowned Scottish scientist Lord Kelvin, in 1861. Shown here is a picture of his original apparatus.

Ideas and examples

This web site provides information on the science behind the Kelvin Probe, ideas for applications, examples of measurements and some comments on current apparatus available. All compiled by Professor Iain D.Baikie who has extensive experience in the technique.
If you did not find what you were looking for please contact us directly, we welcome any comments and questions related to the Kelvin Probe or this site.